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Record number: 1, Textual support number: 1 OBS

Burn-in, or accelerated-temperature-stress testing, may be accomplished in a specific period of time at a constant temperature, or during a series of constant time periods at successively higher temperatures. The latter is sometimes known as step-temperature-stress testing. Devices may be burned-in under static conditions, with bias power applied to their inputs and with their outputs tied to common. They may also be burned in under dynamic conditions, with normal input stimuli applied (including clocks and data).  1, fiche 1, Anglais, - burn%2Din%20test%20equipment

Fiche 1,  Justifications,  Français

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